On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges

• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 1409–1418, doi:10.3762/bjnano.11.125

• interactions were represented using Generalized Maxwell models (Figure 1b) with the parameters given in Table 1. The AFM tip was treated as a spherical indenter with a radius of curvature of 5 nm, and its incorporation into the viscoelastic model followed the numerical implementation of the method of

Resonance of graphene nanoribbons doped with nitrogen and boron: a molecular dynamics study

• Ye Wei,
• Haifei Zhan,
• Kang Xia,
• Wendong Zhang,
• Shengbo Sang and
• Yuantong Gu

Beilstein J. Nanotechnol. 2014, 5, 717–725, doi:10.3762/bjnano.5.84

• different dopants. The study will be carried out by large-scale molecular dynamics (MD) simulations. Both perfect and defective (with initial vacancies) GNRs doped with boron and nitrogen will be considered. Numerical implementation Based on large-scale molecular dynamics (MD) simulations, a series of

Large-scale atomistic and quantum-mechanical simulations of a Nafion membrane: Morphology, proton solvation and charge transport

• Pavel V. Komarov,
• Pavel G. Khalatur and
• Alexei R. Khokhlov

Beilstein J. Nanotechnol. 2013, 4, 567–587, doi:10.3762/bjnano.4.65

• to increase the size of simulated systems and use rather complex variants of DFT. We used a recently modified version of the code CP2K/Quickstep [85], which is a numerical implementation of the Gaussian and plane waves (GPW) method [90] based on the Kohn–Sham formulation of DFT. The electronic charge

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

• Jeffrey C. Williams and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

• consists of (i) defining the system parameters (cantilever eigenfrequencies, force constants and quality factors, free flexural amplitude and amplitude setpoint, tip–sample force model, etc.); (ii) numerical implementation of the amplitude-modulation imaging scheme; (iii) recording of the flexural and

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

• Joachim Welker,
• Esther Illek and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

• Sader–Jarvis method. However, the matrix method generally provides the higher deconvolution quality. Keywords: frequency-modulation atomic force microscopy; force deconvolution; numerical implementation; Introduction The atomic force microscope (AFM) was invented 25 years ago as an offspring of the

Modeling noncontact atomic force microscopy resolution on corrugated surfaces

• Kristen M. Burson,
• Mahito Yamamoto and
• William G. Cullen

Beilstein J. Nanotechnol. 2012, 3, 230–237, doi:10.3762/bjnano.3.26

• ) is equivalent to choosing (C1, ρs), according to Equation 7. Thus, in our numerical implementation we choose values for w0 and h0. As a first check on our substrate by numerical integration, we compare the numerical integration of Equation 2 with the analytical result in Equation 6. In this case the